Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules

Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He. Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. In IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29 - November 1, 2017. pages 1525-1530, IEEE, 2017. [doi]

Abstract

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