Wei Luo, Rui Jia, Longjie Wang, Chunlin Guo, Shuai Jiang, Xiaorang Tian, Xiaoping Ouyang 0001, Xing Li. The effect of silicon films impurity compensation on the performance of silicon drift detector. Microelectronics Journal, 138:105856, 2023. [doi]
@article{LuoJWGJT0L23,
title = {The effect of silicon films impurity compensation on the performance of silicon drift detector},
author = {Wei Luo and Rui Jia and Longjie Wang and Chunlin Guo and Shuai Jiang and Xiaorang Tian and Xiaoping Ouyang 0001 and Xing Li},
year = {2023},
doi = {10.1016/j.mejo.2023.105856},
url = {https://doi.org/10.1016/j.mejo.2023.105856},
researchr = {https://researchr.org/publication/LuoJWGJT0L23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {138},
pages = {105856},
}