MaMiNet: Memory-attended multi-inference network for surface-defect detection

Xiaoyan Luo, Sen Li, Yu Wang, Tiancheng Zhan, Xiaofeng Shi, Bo Liu. MaMiNet: Memory-attended multi-inference network for surface-defect detection. Computers in Industry, 145:103834, 2023. [doi]

Authors

Xiaoyan Luo

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Sen Li

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Yu Wang

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Tiancheng Zhan

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Xiaofeng Shi

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Bo Liu

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