Xiaoyan Luo, Sen Li, Yu Wang, Tiancheng Zhan, Xiaofeng Shi, Bo Liu. MaMiNet: Memory-attended multi-inference network for surface-defect detection. Computers in Industry, 145:103834, 2023. [doi]
@article{LuoLWZSL23,
title = {MaMiNet: Memory-attended multi-inference network for surface-defect detection},
author = {Xiaoyan Luo and Sen Li and Yu Wang and Tiancheng Zhan and Xiaofeng Shi and Bo Liu},
year = {2023},
doi = {10.1016/j.compind.2022.103834},
url = {https://doi.org/10.1016/j.compind.2022.103834},
researchr = {https://researchr.org/publication/LuoLWZSL23},
cites = {0},
citedby = {0},
journal = {Computers in Industry},
volume = {145},
pages = {103834},
}