On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition - researchr publication authors

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Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg. On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectronics Reliability, 88:563-567, 2018. [doi]

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