Stephen L. Lusky, T. Sridhar. Detectable CMOS Faults in Switch-Level Simulation. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 875-883, IEEE Computer Society, 1985.
@inproceedings{LuskyS85,
title = {Detectable CMOS Faults in Switch-Level Simulation},
author = {Stephen L. Lusky and T. Sridhar},
year = {1985},
researchr = {https://researchr.org/publication/LuskyS85},
cites = {0},
citedby = {0},
pages = {875-883},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}