Seth Lyles, Mark Desantis, John Donaldson, Micaela Gallegos, Hannah Nyholm, Claire Taylor, Kristine Monteith. Machine Learning Analysis of Memory Images for Process Characterization and Malware Detection. In 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN Workshops 2022, Baltimore, MD, USA, June 27-30, 2022. pages 162-169, IEEE, 2022. [doi]
Abstract is missing.