Path integral solution of the Li-Chen equation and its application to global dynamic reliability via time-variant extreme process

Meng-Ze Lyu, Yi Luo, Shenghan Zhang, Michael Beer. Path integral solution of the Li-Chen equation and its application to global dynamic reliability via time-variant extreme process. Rel. Eng. & Sys. Safety, 272:112474, 2026. [doi]

Abstract

Abstract is missing.