Optimal allocation of test resources for software reliability growth modeling in software development

Michael R. Lyu, Sampath Rangarajan, Aad P. A. van Moorsel. Optimal allocation of test resources for software reliability growth modeling in software development. IEEE Transactions on Reliability, 51(2):183-192, 2002. [doi]

Authors

Michael R. Lyu

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Sampath Rangarajan

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Aad P. A. van Moorsel

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