Michael R. Lyu, Sampath Rangarajan, Aad P. A. van Moorsel. Optimal allocation of test resources for software reliability growth modeling in software development. IEEE Transactions on Reliability, 51(2):183-192, 2002. [doi]
@article{LyuRM02,
title = {Optimal allocation of test resources for software reliability growth modeling in software development},
author = {Michael R. Lyu and Sampath Rangarajan and Aad P. A. van Moorsel},
year = {2002},
doi = {10.1109/TR.2002.1011524},
url = {http://dx.doi.org/10.1109/TR.2002.1011524},
researchr = {https://researchr.org/publication/LyuRM02},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {51},
number = {2},
pages = {183-192},
}