Chengxia Ma, Yuan Chao, JunJie Zhu, Yaqian Wang, Wenhui Liu, Zhenhua Han. Chip Surface Defect Recognition based on Improved Faster R-CNN. In 28th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2022, Nanjing, China, November 16-18, 2022. pages 1-6, IEEE, 2022. [doi]
Abstract is missing.