Data pre-emphasis based retention reliability enhance scheme for MLC NAND Flash memories - researchr publication authors

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Haozhi Ma, Zhongyi Gao, Liyang Pan, Jun Xu. Data pre-emphasis based retention reliability enhance scheme for MLC NAND Flash memories. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

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