Xin Ma, Hao Hu, Yizi Shang. A New Method for Transformer Fault Prediction Based on Multifeature Enhancement and Refined Long Short-Term Memory. IEEE T. Instrumentation and Measurement, 70:1-11, 2021. [doi]
@article{MaHS21-0,
title = {A New Method for Transformer Fault Prediction Based on Multifeature Enhancement and Refined Long Short-Term Memory},
author = {Xin Ma and Hao Hu and Yizi Shang},
year = {2021},
doi = {10.1109/TIM.2021.3098383},
url = {https://doi.org/10.1109/TIM.2021.3098383},
researchr = {https://researchr.org/publication/MaHS21-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {70},
pages = {1-11},
}