A New Method for Transformer Fault Prediction Based on Multifeature Enhancement and Refined Long Short-Term Memory

Xin Ma, Hao Hu, Yizi Shang. A New Method for Transformer Fault Prediction Based on Multifeature Enhancement and Refined Long Short-Term Memory. IEEE T. Instrumentation and Measurement, 70:1-11, 2021. [doi]

Abstract

Abstract is missing.