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Characterization of stack behavior under soft errors

Junchi Ma, Yun Wang. Characterization of stack behavior under soft errors. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1534-1539, IEEE, 2017. [doi]

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Junchi Ma

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Yun Wang

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