A run-time built-in approach of TID test in SRAM based FPGAs

Ning Ma, Shaojun Wang, Datong Liu, Yu Peng. A run-time built-in approach of TID test in SRAM based FPGAs. Microelectronics Reliability, 64:42-47, 2016. [doi]

Authors

Ning Ma

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Shaojun Wang

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Datong Liu

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Yu Peng

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