Ning Ma, Shaojun Wang, Datong Liu, Yu Peng. A run-time built-in approach of TID test in SRAM based FPGAs. Microelectronics Reliability, 64:42-47, 2016. [doi]
@article{MaWLP16,
title = {A run-time built-in approach of TID test in SRAM based FPGAs},
author = {Ning Ma and Shaojun Wang and Datong Liu and Yu Peng},
year = {2016},
doi = {10.1016/j.microrel.2016.07.128},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.128},
researchr = {https://researchr.org/publication/MaWLP16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {42-47},
}