Chenyue Ma, Hao Wang, Chenfei Zhang, Xiufang Zhang, Jin He, Xing Zhang. Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device. Microelectronics Reliability, 50(8):1077-1080, 2010. [doi]
@article{MaWZZHZ10,
title = {Temperature dependence of the interface state distribution due to hot carrier effect in FinFET device},
author = {Chenyue Ma and Hao Wang and Chenfei Zhang and Xiufang Zhang and Jin He and Xing Zhang},
year = {2010},
doi = {10.1016/j.microrel.2010.04.017},
url = {http://dx.doi.org/10.1016/j.microrel.2010.04.017},
researchr = {https://researchr.org/publication/MaWZZHZ10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {8},
pages = {1077-1080},
}