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Investigating the TDDB lifetime growth mechanism caused by proton irradiation in partially depleted SOI devices

Teng Ma, Xuefeng Yu, Jiangwei Cui, Qiwen Zheng, Hang Zhou, Dandan Su, Qi Guo. Investigating the TDDB lifetime growth mechanism caused by proton irradiation in partially depleted SOI devices. Microelectronics Reliability, 81:112-116, 2018. [doi]

Authors

Teng Ma

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Xuefeng Yu

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Jiangwei Cui

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Qiwen Zheng

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Hang Zhou

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Dandan Su

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Qi Guo

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