Yong Ma, Yongjian Yu, Jian Lu, Qiaoyun Zou, Huibin Zhang. Effect of manufacturing technics on the microstructure and temperature-affected electrical performance of D-type latch devices. Microelectronics Journal, 99:104757, 2020. [doi]
@article{MaYLZZ20,
title = {Effect of manufacturing technics on the microstructure and temperature-affected electrical performance of D-type latch devices},
author = {Yong Ma and Yongjian Yu and Jian Lu and Qiaoyun Zou and Huibin Zhang},
year = {2020},
doi = {10.1016/j.mejo.2020.104757},
url = {https://doi.org/10.1016/j.mejo.2020.104757},
researchr = {https://researchr.org/publication/MaYLZZ20},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {99},
pages = {104757},
}