The development of effective model for thermal conduction analysis for 2.5D packaging using TSV interposer

He Ma, Daquan Yu, Jun Wang. The development of effective model for thermal conduction analysis for 2.5D packaging using TSV interposer. Microelectronics Reliability, 54(2):425-434, 2014. [doi]

Authors

He Ma

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Daquan Yu

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Jun Wang

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