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Using quality metrics with laser range scanners

David K. MacKinnon, Victor Aitken, François Blais. Using quality metrics with laser range scanners. In Brian D. Corner, Masaaki Mochimaru, Robert Sitnik, editors, Proceedings of the Conference on Three-Dimensional Image Capture and Applications 2008, San Jose, CA, USA, January 28-29, 2008. Volume 6805 of SPIE Proceedings, SPIE, 2008. [doi]

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