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Hierarchical characterization procedures for dimensional metrology

David K. MacKinnon, Jean-Angelo Beraldin, Luc Cournoyer, Benjamin Carrier. Hierarchical characterization procedures for dimensional metrology. In J.-Angelo Beraldin, Geraldine S. Cheok, Michael B. McCarthy, Ulrich Neuschaefer-Rube, Atilla Baskurt, Ian E. McDowall, Margaret Dolinsky, editors, Three-Dimensional Imaging, Interaction, and Measurement, San Francisco Airport, California, USA, January 24-27, 2011. Volume 7864 of SPIE Proceedings, pages 786402, SPIE, 2011. [doi]

Authors

David K. MacKinnon

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Jean-Angelo Beraldin

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Luc Cournoyer

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Benjamin Carrier

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