Exploratory and confirmatory factor analysis in morphometry

Alexei Manso Correa Machado, James C. Gee, Mario F. M. Campos. Exploratory and confirmatory factor analysis in morphometry. In Kenneth M. Hanson, editor, Medical Imaging 2000: Image Processing, San Diego, CA, United States, 12-18 February 2000. Volume 3979 of SPIE Proceedings, SPIE, 2000. [doi]

Authors

Alexei Manso Correa Machado

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James C. Gee

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Mario F. M. Campos

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