Alexei Manso Correa Machado, James C. Gee, Mario F. M. Campos. Exploratory and confirmatory factor analysis in morphometry. In Kenneth M. Hanson, editor, Medical Imaging 2000: Image Processing, San Diego, CA, United States, 12-18 February 2000. Volume 3979 of SPIE Proceedings, SPIE, 2000. [doi]
Abstract is missing.