Ross Maciejewski, Stephen Rudolph, Ryan Hafen, Ahmad M. Abusalah, Mohamed Yakout, Mourad Ouzzani, William S. Cleveland, Shaun J. Grannis, Michael Wade, David S. Ebert. Understanding syndromic hotspots - a visual analytics approach. In Proceedings of the IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, Ohio, USA, 19-24 October 2008. pages 35-42, IEEE, 2008. [doi]
Abstract is missing.