Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology

N. Maciel, Elaine Crespo Marques, Lirida A. B. Naviner, Hao Cai. Single-event transient effects on dynamic comparator in 28 nm FDSOI CMOS technology. Microelectronics Reliability, 88:965-968, 2018. [doi]

Abstract

Abstract is missing.