Maxime Madau, Michel Agoyan, Philippe Maurine. An EM Fault Injection Susceptibility Criterion and Its Application to the Localization of Hotspots. In Thomas Eisenbarth, Yannick Teglia, editors, Smart Card Research and Advanced Applications - 16th International Conference, CARDIS 2017, Lugano, Switzerland, November 13-15, 2017, Revised Selected Papers. Volume 10728 of Lecture Notes in Computer Science, pages 180-195, Springer, 2017. [doi]
Abstract is missing.