RDIS: Tolerating Many Stuck-At Faults in Resistive Memory

Rakan Maddah, Rami G. Melhem, Sangyeun Cho. RDIS: Tolerating Many Stuck-At Faults in Resistive Memory. IEEE Transactions on Computers, 64(3):847-861, 2015. [doi]

Authors

Rakan Maddah

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Rami G. Melhem

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Sangyeun Cho

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