Rakan Maddah, Rami G. Melhem, Sangyeun Cho. RDIS: Tolerating Many Stuck-At Faults in Resistive Memory. IEEE Transactions on Computers, 64(3):847-861, 2015. [doi]
@article{MaddahMC15,
title = {RDIS: Tolerating Many Stuck-At Faults in Resistive Memory},
author = {Rakan Maddah and Rami G. Melhem and Sangyeun Cho},
year = {2015},
doi = {10.1109/TC.2013.2295825},
url = {http://doi.ieeecomputersociety.org/10.1109/TC.2013.2295825},
researchr = {https://researchr.org/publication/MaddahMC15},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {64},
number = {3},
pages = {847-861},
}