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Comparative Analysis of Open and Short Defects in Embedded SRAM Using Parasitic Extraction Method for Deep Submicron Technology

Venkatesham Maddela, Sanjeet Kumar Sinha, Muddapu Parvathi, Vinay Sharma. Comparative Analysis of Open and Short Defects in Embedded SRAM Using Parasitic Extraction Method for Deep Submicron Technology. Wireless Personal Communications, 132(3):2123-2141, October 2023. [doi]

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