Benjamin Maddox, Cameron Deans, Han Yao, Yuval Cohen, Ferruccio Renzoni. Rapid Electromagnetic Induction Imaging With an Optically Raster-Scanned Atomic Magnetometer. IEEE T. Instrumentation and Measurement, 72:1-5, 2023. [doi]
@article{MaddoxDYCR23, title = {Rapid Electromagnetic Induction Imaging With an Optically Raster-Scanned Atomic Magnetometer}, author = {Benjamin Maddox and Cameron Deans and Han Yao and Yuval Cohen and Ferruccio Renzoni}, year = {2023}, doi = {10.1109/TIM.2023.3261906}, url = {https://doi.org/10.1109/TIM.2023.3261906}, researchr = {https://researchr.org/publication/MaddoxDYCR23}, cites = {0}, citedby = {0}, journal = {IEEE T. Instrumentation and Measurement}, volume = {72}, pages = {1-5}, }