Rapid Electromagnetic Induction Imaging With an Optically Raster-Scanned Atomic Magnetometer

Benjamin Maddox, Cameron Deans, Han Yao, Yuval Cohen, Ferruccio Renzoni. Rapid Electromagnetic Induction Imaging With an Optically Raster-Scanned Atomic Magnetometer. IEEE T. Instrumentation and Measurement, 72:1-5, 2023. [doi]

Abstract

Abstract is missing.