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Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients

Gian Luigi Madonna, Andrea Ferrero, Marco Pirola, Umberto Pisani. Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients. IEEE T. Instrumentation and Measurement, 49(2):285-289, 2000. [doi]

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