Ryota Maeda, Naoki Arikawa, Yutaka No, Shinsaku Hiura. End-to-End Optimization of Polarimetric Measurement and Material Classifier. In Antonino Furnari, Petia Radeva, editors, Proceedings of the 21st International Conference on Computer Vision Theory and Applications, VISAPP 2026, Marbella, Spain, March 9-11, 2026, Volume 2. pages 550-559, SCITEPRESS, 2026. [doi]
Abstract is missing.