Toshiyuki Maeda, Kozo Kinoshita. Precise test generation for resistive bridging faults of CMOS combinational circuits. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 510-519, IEEE Computer Society, 2000.
@inproceedings{MaedaK00:0, title = {Precise test generation for resistive bridging faults of CMOS combinational circuits}, author = {Toshiyuki Maeda and Kozo Kinoshita}, year = {2000}, tags = {testing}, researchr = {https://researchr.org/publication/MaedaK00%3A0}, cites = {0}, citedby = {0}, pages = {510-519}, booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, publisher = {IEEE Computer Society}, }