Juan Antonio Maestro, Pedro Reviriego. Study of the effects of MBUs on the reliability of a 150 nm SRAM device. In Limor Fix, editor, Proceedings of the 45th Design Automation Conference, DAC 2008, Anaheim, CA, USA, June 8-13, 2008. pages 930-935, ACM, 2008. [doi]
Abstract is missing.