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Metrics-based detection of micro patterns

Stefano Maggioni, Francesca Arcelli. Metrics-based detection of micro patterns. In Gerardo Canfora, Giulio Concas, Michele Marchesi, Ewan D. Tempero, Hongyu Zhang, editors, Proceedings of the 2010 ICSE Workshop on Emerging Trends in Software Metrics, WETSoM 2010, Cape Town, South Africa, May 4, 2010. pages 39-46, ACM, 2010. [doi]

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