Reversible nonvolatile and threshold switching characteristics in Cu/high-k/Si devices

Chandreswar Mahata, Wonwoo Kim, Shiwhan Kim, Muhammad Ismail, Min-Hwi Kim, Sungjun Kim, Byung-Gook Park. Reversible nonvolatile and threshold switching characteristics in Cu/high-k/Si devices. IEICE Electronic Express, 16(16):20190404, 2019. [doi]

@article{MahataKKIKKP19,
  title = {Reversible nonvolatile and threshold switching characteristics in Cu/high-k/Si devices},
  author = {Chandreswar Mahata and Wonwoo Kim and Shiwhan Kim and Muhammad Ismail and Min-Hwi Kim and Sungjun Kim and Byung-Gook Park},
  year = {2019},
  doi = {10.1587/elex.16.20190404},
  url = {https://doi.org/10.1587/elex.16.20190404},
  researchr = {https://researchr.org/publication/MahataKKIKKP19},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {16},
  number = {16},
  pages = {20190404},
}