Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen. Offset measurement method for accurate characterization of BTI-induced degradation in opamps. In 19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012. pages 661-664, IEEE, 2012. [doi]
@inproceedings{MahatoWMG12,
title = {Offset measurement method for accurate characterization of BTI-induced degradation in opamps},
author = {Swaraj Mahato and Pieter De Wit and Elie Maricau and Georges G. E. Gielen},
year = {2012},
doi = {10.1109/ICECS.2012.6463639},
url = {http://dx.doi.org/10.1109/ICECS.2012.6463639},
researchr = {https://researchr.org/publication/MahatoWMG12},
cites = {0},
citedby = {0},
pages = {661-664},
booktitle = {19th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2012, Seville, Spain, December 9-12, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1259-2},
}