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Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers

Parvez Mahbub, Mohammad Masudur Rahman 0001. Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers. In IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2024, Rovaniemi, Finland, March 12-15, 2024. pages 308-319, IEEE, 2024. [doi]

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Parvez Mahbub

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Mohammad Masudur Rahman 0001

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