Parvez Mahbub, Mohammad Masudur Rahman 0001. Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers. In IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2024, Rovaniemi, Finland, March 12-15, 2024. pages 308-319, IEEE, 2024. [doi]
@inproceedings{Mahbub024,
title = {Predicting Line-Level Defects by Capturing Code Contexts with Hierarchical Transformers},
author = {Parvez Mahbub and Mohammad Masudur Rahman 0001},
year = {2024},
doi = {10.1109/SANER60148.2024.00038},
url = {https://doi.org/10.1109/SANER60148.2024.00038},
researchr = {https://researchr.org/publication/Mahbub024},
cites = {0},
citedby = {0},
pages = {308-319},
booktitle = {IEEE International Conference on Software Analysis, Evolution and Reengineering, SANER 2024, Rovaniemi, Finland, March 12-15, 2024},
publisher = {IEEE},
isbn = {979-8-3503-3066-3},
}