On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation

Islam A. K. M. Mahfuzul, Hidetoshi Onodera. On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation. IEICE Transactions, 96-D(9):1971-1979, 2013. [doi]

Abstract

Abstract is missing.