Characterization and compensation of performance variability using on-chip monitors

Islam A. K. M. Mahfuzul, Hidetoshi Onodera. Characterization and compensation of performance variability using on-chip monitors. In Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014, Hsinchu, Taiwan, April 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

Abstract

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