SIFER: Scale-Invariant Feature Detector with Error Resilience

Pradip Mainali, Gauthier Lafruit, Qiong Yang, Bert Geelen, Luc J. Van Gool, Rudy Lauwereins. SIFER: Scale-Invariant Feature Detector with Error Resilience. International Journal of Computer Vision, 104(2):172-197, 2013. [doi]

Abstract

Abstract is missing.