Yohandri Mairizwan, Akmam. Development of a Digital Resistivity Meter Based on Microcontroller. In TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018. pages 551-554, IEEE, 2018. [doi]
@inproceedings{MairizwanA18, title = {Development of a Digital Resistivity Meter Based on Microcontroller}, author = {Yohandri Mairizwan and Akmam}, year = {2018}, doi = {10.1109/TENCON.2018.8650464}, url = {https://doi.org/10.1109/TENCON.2018.8650464}, researchr = {https://researchr.org/publication/MairizwanA18}, cites = {0}, citedby = {0}, pages = {551-554}, booktitle = {TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018}, publisher = {IEEE}, isbn = {978-1-5386-5457-6}, }