Development of a Digital Resistivity Meter Based on Microcontroller

Yohandri Mairizwan, Akmam. Development of a Digital Resistivity Meter Based on Microcontroller. In TENCON 2018 - 2018 IEEE Region 10 Conference, Jeju, South Korea, October 28-31, 2018. pages 551-554, IEEE, 2018. [doi]

Abstract

Abstract is missing.