Tapas K. Maiti, Santanu Chattopadhyay. Don t care filling for power minimization in VLSI circuit testing. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 2637-2640, IEEE, 2008. [doi]
@inproceedings{MaitiC08,
title = {Don t care filling for power minimization in VLSI circuit testing},
author = {Tapas K. Maiti and Santanu Chattopadhyay},
year = {2008},
doi = {10.1109/ISCAS.2008.4541998},
url = {http://dx.doi.org/10.1109/ISCAS.2008.4541998},
tags = {testing},
researchr = {https://researchr.org/publication/MaitiC08},
cites = {0},
citedby = {0},
pages = {2637-2640},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA},
publisher = {IEEE},
}