Tutorial 1: The Promise of High-Metal Gates-From Electronic Transport Phenomena to Emerging Device/Circuit Applications

K. Maitra. Tutorial 1: The Promise of High-Metal Gates-From Electronic Transport Phenomena to Emerging Device/Circuit Applications. In 9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. pages 3, IEEE Computer Society, 2008. [doi]

Abstract

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