Hillol Maity, Kaushik Khatua, Santanu Chattopadhyay, Indranil Sengupta 0001, Girish Patankar, Parthajit Bhattacharya. A New Test Vector Reordering Technique for Low Power Combinational Circuit Testing. In 3rd International Symposium on Devices, Circuits and Systems, ISDCS 2020, Howrah, India, March 4-6, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.